Daniel R Plante wrote:
then the empirical breakdown difference measured between thick and thin layers would vanish.
Idiot, no, they would not. Breakdown is caused by avalanche ionization of dielectric. Nano-thin dielectrics don't have avalanche ionization because there is not enough voltage in them.
Instead nano-thin capacitors start leaking current at few volts due to quantum tunneling.
And record achieved for nano-thin-film is 3000 Volt/um.
Nope. Regardless of thickness, tunneling current, etc - if "breakdown" occurs, it would have had to start at some point of nucleation. What is the nucleation point?
Programmer, Applied Science Technologist (AScT). Automated Test Engineering (ATE), shop 153, CFB Esquimalt, Box 17000 Station Forces, Victoria, BC, Canada V9A 7N2. My direct line: (250) 363-2061. Home: (250) 382-0068